Münster 1997 – scientific programme
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DS: Dünne Schichten
DS 33: Postersitzung
DS 33.15: Poster
Tuesday, March 18, 1997, 16:15–17:45, Aula
Ferromagnetic Resonance on Electrodeposited Ni-Films — •J. Pflaum1, E. Huebner1, J. Pelzl1, J.L. Bubendorff2, J.P. Bucher2, and Z. Frait3 — 1Inst. fuer Experimentalphysik III, Ruhr-Universitaet, 44780 Bochum, Germany — 2IPCMS, 67037 Strasbourg, France — 3Inst. of Physics, Academy of Sciences, 18040 Prague 8, Czech Republic
Ferromagnetic Resonance (FMR) Spectroscopy at microwave-frequencies
of 9GHz to 70GHz was used to study the magnetic properties of thin
electrodeposited Ni films. The polycrystalline samples at thicknesses
of 10Å to 4000Å were prepared by Watts-bath technique on glass and on
mica substrates with an (111)-textured gold buffer [1]. To estimate the
influence of the microscopic structure on the magnetic parameters
Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM)
studies were performed. From FMR at different in-plane and
out-of-plane orientations of the samples in the external field
we obtain the magnetization, the g-factor, and the uniaxial anisotropy
contribution. Variation of the film thickness yields an effective surface
anisotropy, KS, with a preferred alignment of the magnetization
in the film plane. In comparison to single crystalline Ni samples KS
is considerably increased. In addition, the sensitivity of the FMR linewidth
on structural imperfections enabled us to qualify the coherence of the
film growth.
Supported by DFG (SFB166) and by VW-foundation.
[1] J.L. Bubendorff et al., J. Magn. Magn. Mat. (1996) to be published