Münster 1997 – wissenschaftliches Programm
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DS: Dünne Schichten
DS 33: Postersitzung
DS 33.39: Poster
Dienstag, 18. März 1997, 16:15–17:45, Aula
SrTiO3 bicrystal boundaries studied with X-ray diffraction and STM — •A. Kazimirov1, J. Zegenhagen1, Q. Jiang1, T. Haage1, and R. Feidenhans’l2 — 1Max-Planck-Institut für Festkörperforschung, Stuttgart, Germany — 2Risø National Laboratory, Roskilde, Denmark
The detailed structure of the SrTiO3 bicrystal interface are of great interest e.g. with respect to oxygen sensor technology, where the oxygen transport is influenced by crystalline boundaries, or in view of applications of producing Josephson junctions in epitaxial High-Tc superconducting thin films. We studied a buried SrTiO3(103) bicrystal boundary with X-ray diffraction at the ESRF, material science beamline. Recording the crystal truncation rod (CTR) scattering from both parts of the bicrystal we observed satellite features, characteristic of density modulations at the interface with a period of 50 lattice units. A vacuum exposed and annealed bicrystal boundary, studied for comparison in UHV with STM and atomic resolution, was found to be strongly facetted. Implications on e.g. Josephson junctions will be discussed.