Münster 1997 – wissenschaftliches Programm

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O: Oberflächenphysik

O 4: Raster-Kraft-Mikroskopie I

O 4.5: Vortrag

Montag, 17. März 1997, 10:30–10:45, BOT

FUZZY LOGIC CONTROL APPLIED TO SCANNING PROBE MICROSCOPY — •F.M. BATTISTON, M. BAMMERLIN, R. LÜTHI, E. MEYER, M. GUGGISBERG, J. LÜ, L. HOWALD, and H.-J. GÜNTHERODT — Institut für Physik Universität Basel Klingelbergstrasse 82 CH-4056 Basel Schweiz.

A novel feedback control based on fuzzy logic has been applied to scanning probe methods like atomic force (AFM) and scanning tunneling microscopy (STM). The fuzzy logic gives the possibility to switch smoothly between AFM and STM mode. The fuzzy controller was implemented using a digital signal processor (DSP) board and has been successfully tested with a combined AFM/STM, which was operated in ultrahigh vacuum (UHV). Besides the technical realization of the fuzzy logic control system, first results obtained on the Si(111)7×7 reconstructed surface will be presented and discussed.