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SYB: Symposium Polymere und kleine Moleküle an Grenzflächen
SYB 1: Polymere und kleine Moleküle an Grenzflächen
SYB 1.6: Vortrag
Dienstag, 10. März 1998, 11:30–11:50, H18
Influence of preparation conditions on roughness and dewetting of thin polymer films — •P. M"uller-Buschbaum and M. Stamm — Max-Planck-Institut f"ur Polymerforschung, Ackermannweg 10, 55128 Mainz (Germany)
The surface morphology of thin polymer films (polystyrene) on top of silicon substrates as prepared by spin-coating and after the dewetting of an initially homogeneous polymer film was examined. We investigated the influence of film thickness in the range of 50Å up to 5000Å, of molecular weight between 9 kg/mol and 672 kg/mol, of annealing temperature below and above the glass transition temperature Tg and of the used solvent. Optical microscopy, optical phase interference microscopy and scanning force microscopy were applied to investigate surface structures on different length scales. With diffuse x-ray scattering in the region of total external reflection a depth sensitivity was achieved. The in-plane structure of the untreated samples shows significant differences concerning roughness correlation [1]. Well above the glass transition temperature this roughness correlation was lost and therefore has no influence on the dewetting behavior of the polymer films. A variation of the solvent used for the spin-coating gives rise to different dewetting structures which originate from different in-plane film structures right after the preparation. Additionally the influence of different substrate treatments are tested with respect to the dewetting of the polymer film.
[1] V. Holý, T. Baumbach; Phys. Rev. B 49, 10668 (1994)