Regensburg 1998 – scientific programme

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AM: Magnetismus

AM 14: Dünne magnetische Schichten und Vielfachschichten, magnetooptische Schichten IV

AM 14.8: Talk

Wednesday, March 25, 1998, 18:45–19:00, H10

Explicit solutions for magneto-optic materials in generalized ellipsometry — •Mathias Schubert¹, Thomas E. Tiewald², and John A. Woollam² — ¹Faculty of Physics and Geoscience, Department of Semiconductor Physics, University Leipzig, Linnéstra"se 5, D-04103 Leipzig, Germany — ²Center for Microelectronic and Optical Materials Research, and Department of Electrical Engineering, University of Nebraska, Lincoln, NE 68588, U.S.A.

We propose the application of generalized ellipsometry to a large variety of magneto-optic phenomena. The generalized ellipsometric parameters of homogeneously layered systems having non-symmetric, i.e., magneto-optic, dielectric properties are obtained from a recently reviewed 4x4 matrix approach [1,2]. Explicit solutions allow future analysis of generalized ellipsometric data of multilayered magneto-optic media regardless of the orientation of the material magnetization and crystalline axes, and the angle of light-incidence. Possible experimental thin-film situations are illustrated for birefringent free-carrier effects in heavily-doped semiconductor thin films, and for oblique magnetization directions in magneto-optic multilayer systems. [1] M. Schubert et al., J. Opt. Soc. Am. A 13, 875 (1996); M. Schubert, Phys. Rev. B 53, 4265 (1996).