Regensburg 1998 – wissenschaftliches Programm
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HL: Halbleiterphysik
HL 4: Optische Eigenschaften I
HL 4.8: Vortrag
Montag, 23. März 1998, 12:15–12:30, H13
Birefringence and reflectivity of single crystal CdAl22Se4 by generalized ellipsometry — •Jan-David Hecht1, Mathias Schubert1, Andreas Eifler1, Volker Riede1, G"unter Krau"s2, and Volker Kr"amer2 — 1Faculty of Physics and Geoscience, University Leipzig, Linnéstra"se 5, D-04103 Leipzig — 2Freiburg Materialforschungszentrum und Kristallographisches Institut, Albert-Ludwigs-Universit"at, Stefan-Meier-Stra"se 21, 79104 Freiburg
Transmission and reflection generalized variable angle spectroscopic ellipsometry (gVASE) and polarized transmission intensity (PTI) measurements over the photon energy range from 0.74 to 5.0 eV have been used to characterize the optical properties of the ordered-vacancy compound CdAl2Se4. We obtain the uniaxial below-gap major refractive index dispersions. Above the fundamental band gap we assign four possible critical point structures from line-shape analysis of the sample dielectric function and its second derivative.