Bereiche | Tage | Auswahl | Suche | Downloads | Hilfe

HK: Physik der Hadronen und Kerne

HK 37: Postersitzung / Instrumentation und Anwendungen II

HK 37.3: Poster

Mittwoch, 24. März 1999, 10:15–12:00, Foyer

A Compton polarimeter for Parametric X-radiation — •Dmitry Pugachev, Hossain Shooshtari, Gerd Buschhorn, Rainer Kotthaus, and Peter Weinmann — Max-Planck-Institut für Physik (Werner-Heisenberg-Institut), Föhringer Ring 6, D-80805 München

A compact Compton polarimeter to be used for energy resolved linear polarization analysis of large angle Parametric X-radiation (PXR) in the energy range from 3 to 20 keV has been designed, built and calibrated with monochromatized synchrotron radiation. The instrument employs 4 thermoelectrically cooled silicon photodiodes to determine the linear polarization vector by measuring the azimuthal angular modulation of X-rays scattered off a 500µ m thick beryllium foil. The analyzing power is measured to be 75% as expected for a scattering angle of 110^∘. For fully polarized X-rays the orientation of the polarization plane is determined to within less than 1^∘