Heidelberg 1999 – scientific programme

Parts | Days | Selection | Search | Downloads | Help

KY: Kybernetik

KY 5: Weitere Beiträge (Artikel)

KY 5.3: Poster

Monday, March 15, 1999, 13:00–14:00, ZO 3

The Berry-Phase applied to optical Metrology — •Ulrich Krackhardt and k.-H. Brenner — Universität Mannheim, Lehrstuhl für Optoelektronik, B6, 26, 68131 Mannheim

An important goal in optical metrology is the enlargement of the probing volume without affecting spatial resolution. To this end multiple-wavelength techniques are commonly applied. The drawback is, however, that individual calibrations of the set-up are necessary for each wavelength. Since the topological phase, also known as Berry- or Pancharatnam - phase, is independent of wavelength, this concept can be used to realize wavelength independent phase-shifting techniques. The concept, presented here, is based on polarization optics. It will be shown that the concept of topological phase is a handy tool for designing and understanding advanced optical set-ups.