Münster 1999 – scientific programme
Parts | Days | Selection | Search | Downloads | Help
CP: Chemische Physik
CP 25: Poster: Symposium: Benetzung und dünne Filme
CP 25.6: Poster
Monday, March 22, 1999, 18:00–20:00, R52/R72
Capillary Waves on Dewetted Polymer Film Surfaces — •M. Tolan1, O.H. Seeck1, J.-P. Schlomka1, W. Press1, J. Wang2, S.K. Sinha2, Z. Li3, M.H. Rafailovich3, and J. Sokolov3 — 1Institut f"ur Experimentelle und Angewandte Physik, Universit"at Kiel, Leibnizstr. 19, D-24118 Kiel — 2XFD/APS Argonne National Laboratory, 9700 South Cass Ave., Argonne, IL 60439 — 3Department of Materials Science and Engineering, State University of New York at Stony Brook, NY 11794-2275
Surfaces of thin dewetted polyethylene-propylene films were investigated by atomic force microscopy (AFM) and x-ray scattering. The AFM images show the mesoscopic island structure but do not give information about the microscopic roughness of the polymer surface. Together with the AFM data we were able to identify capillary waves on the island surfaces by their specific power-laws in the diffuse x-ray scattering signal. The wavenumber spectrum of these waves is modified by a cutoff introduced by the van der Waals substrate-film interactions.