Münster 1999 – scientific programme

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CP: Chemische Physik

CP 3: Symposium: Benetzung und dünne Filme

CP 3.5: Talk

Monday, March 22, 1999, 15:30–15:45, Phy

Measurement of the contact line tension on solid surfaces with varying interfacial energy by nanometer SFM analysis — •Tilo Pompe, Andreas Fery, and Stephan Herminghaus — Max-Planck-Institut für Kolloid- und Grenzflächenforschung, Rudower Chaussee 5, 12489 Berlin

Liquid structures on solid substrates are imaged with a resolution in the nanometer range by Scanning Force Microscopy in Tapping mode. Using substrates with an artificially patterned wettability, characteristic features in the three-phase contact line are induced, which allow us to determine the contact line tension. The values in the range of −1 x 10⁻¹⁰ N we obtain for sessile droplets of hexaethylene glycol are consistent with theoretical predictions. Further changes in the interfacial energy of the substrate surface allow the investigation of the dependence of the contact line tension on Young’s contact angle and comparision with different theoretical predictions.