Münster 1999 – scientific programme

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DS: Dünne Schichten

DS 25: Magnetische Schichten II

DS 25.1: Fachvortrag

Wednesday, March 24, 1999, 17:00–17:15, PC 7

X-Ray and Neutron Reflectivity Investigation of NiMnSb thin films and NiMnSb/V multilayer systems — •M. Tolan, A. Doerr, T. Seydel, W. Prange, J.-P. Schlomka, and W. Press — Institut f"ur Experimentelle und Angewandte Physik, Universit"at Kiel, Leibnizstr. 17-19, 24098 Kiel

The ferromagnetic Heusler alloy NiMnSb is a possible candidate for novel magnetic field sensors based on the giant magneto resistance effect.
Thin films of NiMnSb as well as NiMnSb/V multilayers were grown by Ar ion beam sputtering on Si and MgO substrates. in situ x-ray reflectivity measurements were applied to investigate the evolution of the interfacial roughness during growth. The crystalline quality of the samples was checked by wide-angle X-ray scattering and the magnetization density profile was obtained by polarized neutron reflectivity.