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O: Oberflächenphysik

O 36: Poster (II)

O 36.60: Poster

Donnerstag, 25. März 1999, 20:00–22:30, Zelt

Scanning probe acoustic microscopy with a cantilever-based sensor — •S. Gao, A. Vaut, G. Becker, and H. Fuchs — WWU M"unster, Physikalisches Institut, Wilhelm-Klemm-Str. 10, 48149 M"unster

In this article we describe a new type of acoustic microscopy related to a scanning tip and a micro-cantilever. It is developed on a scanning electron acoustic microscopy with a cantilever sensor. A modulated force between a tip and the sample is used to generate acoustic wave and a cantilever fixed with the sample is used to detect acoustic wave. The output signal of cantilever increases with the approach of the tip to the sample is used as a signal to obtain a topographic image of the sample. The acoustic image presents sub-micrometer details and it reveals a possibility of obtaining high-resolution acoustic image with our system setup.