Münster 1999 – wissenschaftliches Programm

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SYNS: Symposium Neutronenstreuung zur Untersuchung kondensierter Materie

SYNS 2: Neutronenstreuung II

SYNS 2.3: Hauptvortrag

Dienstag, 23. März 1999, 12:30–13:00, R4

Analysis of Residual Stresses using Neutron Diffraction — •Walter Reimers — Hahn-Meitner-Institut Berlin, Glienicker Str. 100, 14109 Berlin

Residual stresses are known to be important for the mechanical-technological properties and for the lifetime of materials and engineering components. The residual stress state depends on the material and on the technological processing, including the process parameters. This offers the possibility to optimize the stress state in view of the external loading conditions so that the performance and the lifetime of components can be increased.

The residual stress analysis by diffraction techniques are based on the measurement of interplanar lattice distances d of the crystallites forming the material. The different d values measured in different sample orientations then give the stress values using Hooke’s law. Therefore, the diffraction methods can be applied for all crystalline materials. Whereas conventional X-ray diffraction residual stress analysis is limited to the near surface region of materials due to its penetration depth of only some micrometers, neutron diffraction allows the analysis of triaxial residual stresses in the bulk volume of materials. Examples are presented where the unique advantages of neutron diffraction are demonstrated.