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TT: Tiefe Temperaturen
TT 16: Anwendungen der HTSL: Hochfrequenz und Elektronik
TT 16.4: Vortrag
Donnerstag, 25. März 1999, 11:15–11:30, F1
The residual surface impedance Z(T,f,H) of YBCO and their quantitative modelling by the leakage current of weak links — •J. Halbritter — Forschungszentrum Karlsruhe, IMF1, Postfach 3640, 76021 Karlsruhe
In Nb2O5-junctions the critical Josephson current jcJ(T) is accompanied by a small leakage current jbl (∝ 1/Rbl), i.e. Rres is very small. HTS in-plane weak links show a very much reduced jcJ(0)-value compared to theory and a large leakage current jbl (∝ 1/Rbl) of the order of jcJ, due to a high density of intermediate states in disordered HTS. The finite rf residual resistances Rres(T,f,H) by weak links in distanc es aJ are due to the finite normal conducting leakage current with Rbl(T<0.8Tc) ≈ const., where the Rres(T)-dependence is governed by jcJ(T) ≈ jcJ(1−T/Tc). Quantitative agreement experiment - model is obtained by measured values of aJ (≈ 0.2 − 20 µ m) and of jcJ( ≈ 102 − 107 A/cm2) using jcJRbl2 ≈ 10−11 A Ω 2 cm2. Aside of this agreement the T-, f- and H-dependencies Rres(T<0.8Tc,f,H) ≈ R0 (1+T/Tc) fα (1+Hrf/Hc1J) are modelled quantitatively, also by a distribution of weak links (α < 2) with scaling fields Hc1J ∝ √jcJ. Hence for HTS-samples over 7 orders of magnitude up to jcJ ≤ 107 A/cm2, which is much smaller than the intrinsic critical depairing current with 4*108 A/cm2, extrinsic weak link properties describe R(T < 0.8 Tc,f,H) quantitatively.