Regensburg 2000 – scientific programme

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HL: Halbleiterphysik

HL 41: Symposium: Spin-dependent transport in semiconductors - towards a spin transistor

HL 41.6: Fachvortrag

Friday, March 31, 2000, 12:55–13:20, H15

Scanning Hall Probe Microscopy — •Thomas Schweinb/"ock¹, Dieter Weiss¹, Martin Lipinski², and Karl Eberl² — ¹Institut fuer Experimentelle und Angewandte Physik, Universitaet Regensburg, 93040 Regensburg — ²Max-Planck-Institut fuer Festkoerperforschung, Heisenbergstr. 1, 70569 Stuttgart

Scanning Hall Probe Microscopy (SHPM) offers the opportunity,

unlike Magnetic Force Microscopy (MFM), to obtain quantitative

and non-invasive information of magnetic stray fields on a

surface. We describe a new type of SHPM operating at Room

Temperature with a spatial resolution smaller than 300 nm. The

probe-sample distance is controlled by piezo-electrical detection

of the shear forces acting on an oscillating cantilever. The Hall

Probes, which have a Hall coefficient of 0.25 W/G, are

manufactured from prepatterned GaAs wafers overgrown with a

GaAs/AlGaAs heterostructure containing a high mobility

two-dimensional electron gas (2DEG), such that the actual

distance between sample surface and the active region is in the

order of 50 nm. The active Hall area is defined by optical and

electron beam lithography. Measurements of the stray field

pattern of various magnetic samples are shown.