Regensburg 2000 – scientific programme

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O: Oberflächenphysik

O 24: Rastersondentechniken (III)

O 24.5: Talk

Wednesday, March 29, 2000, 15:30–15:45, H44

Ultrasonic cantilever vibrations in tapping-mode atomic force microscopy: Fourier transformed force microscopy — •Robert W. Stark and Wolfgang M. Heckl — Universität München, Institut für Kristallographie und Angewandte Mineralogie, Theresienstr. 41, 80333 München, Germany

In tapping-mode atomic force microscopy (TM-AFM) usually only amplitude and

phase of the cantilever motion are acquired. All higher degree information

is lost. In order to recover all available information, the full cantilever

motion must be analyzed. The periodic tip - sample contact causes specific

ultrasonic cantilever vibrations. In the Fourier-transformed mode, these

ultrasonic vibrations are employed for image formation. A simple model

considering the periodic tip impact onto the sample relates these

oscillations to elastic sample properties.