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SYNA: Carbon Nanotubes

SYNA VIII: HV VIII

SYNA VIII.1: Hauptvortrag

Donnerstag, 30. März 2000, 17:00–17:30, H20

Characterisation and Manipulation of Carbon Nanotubes by SFM und STM — •Wilfried Clauss — Institut für Angewandte Physik, Uni. Tübingen, Auf der Morgenstelle 10, 72074 Tübingen

Characterising Carbon nanotubes is a difficult task due to their small diameters range of only few nanometers. This holds for their structural (lattice orientation, elastic deformations, defects, etc.) as well as for the electronic properties. Scanning probe microscopy and, in particular, scanning tunneling (STM) and scanning force microscopy (SFM), are well-suited methods for these problems. Moreover, in addition to imaging, the microscope probe can be used as a tool for manipulating individual tubes. Based on several examples I will discuss some possibilities and limitations of these methods for the fabrication and characterization of nanotube-based electronic devices.