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A: Atomphysik

A 3: Multi Photon Processes

A 3.1: Vortrag

Montag, 2. April 2001, 15:45–16:00, H1058

Electron - ion coincidence measurements in strong field short pulse laser Xenon atom interactions — •Bernd Witzel¹, Rolf Wiehle¹, Dimitris Charalambidis², and Hanspeter Helm¹ — ¹Universit"at Freiburg, Herman Herder Str.3 — ²Foundation for Research and Technology - Hellas, PO Box 1527, 711 10 Heraklion, Crete, Greece

Two new devices for charged particle coincidence experiments in strong-field, short pulse laser - atom/molecule interactions will be presented. The first device consists of a single time of flight spectrometer, common for both positive and negative charge detection [1][2]. Experimental parameters required for the use of the device in the high intensity regime are discussed. A demonstration of electron - ion coincidence measurements in the interaction of Xe atoms with 60 fs laser pulses at 800 nm and an intensity of 4 10¹3 W/cm² is reported. The second device is a combination of a PEIS - System (photoelectron - imaging spectrometer) with a simple time of flight spectrometer for the ions. Here we discuss the possibility of angular resolved coincidence measurements. [1] B.Witzel. N.A. Papadogniannis und D. Charalambidis , European Phys. J. 12 (2000) 21 [2] B.Witzel. N.A. Papadogniannis und D. Charalambidis, Phys. Rev. Lett. 85 (2000) 2268