Berlin 2001 – scientific programme

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CPP: Chemische Physik und Polymerphysik

CPP 19: Poster: New Methods, Thin Polymer Films, Monolayers

CPP 19.2: Poster

Thursday, April 5, 2001, 12:30–15:00, AT1

Mechanical surface properties of polymers determined with Pulsed-Force Mode Scanning Force Microscopy — •K. Schroth, S. Hild, and O. Marti — Abt. Experimentelle Physik, Universität Ulm

The investigation of surface properties has become an important field in material science. Scanning Force Microscopy provides a method to study surface properties on microscopic scale. Pulsed Force Mode (PFM) enables to measure topography and surface properties like adhesion and local stiffness simultaneously. For this purpose Force vs. Distance Curves are generated by a sinusoidal modulation of the piezo using frequencies in the range of 0.1-5kHz and amplitudes of 10-500nm and characteristic points are recorded.

The aim of this study is to quantify measurements of the local stiffness in PFM. For the quantization experimental parameters like cantilever properties as well as set-up parameters like modulation frequency, modulation amplitude or applied force have been taken into account. Polymers of identical chemical composition but different amount of crosslinking have been investigated. It could be shown that measurements on these polymers, which are performed with different experimental parameters, could be compared.