MS 7: Techniques and New Developments
Donnerstag, 5. April 2001, 17:15–18:30, EB 202
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17:15 |
MS 7.1 |
Design of a Compact, High-Resolution Reflectron Time-of-Flight Mass Spectrometer — •Maria Kulawik, Klaus Rademann, and Wolfgang Christen
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17:30 |
MS 7.2 |
Laser-SNMS analysis and imaging of archaeological findings and semiconductors — •Stefanie M. Walz, Hanspeter Helm, Ulrich Müller, and Martin Meinberger
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17:45 |
MS 7.3 |
Mass Spectrometry of secondary neutrals with an improved instrument based on electron-gas post-ionization (INA-X) — •Werner Bieck, Paul Ecker, Michael Kopnarski, and Hans Oechsner
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18:00 |
MS 7.4 |
Silicon concentrations in silicon doped gallium arsenide single crystals — •B. Wiedemann, J. D. Meyer, D. Jockel, H. C. Freyhardt, B. Birkmann, and G. Müller
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18:15 |
MS 7.5 |
Multiply Charged Metal Cluster Anions — •Alexander Herlert, Lutz Schweikhard, and Manuel Vogel
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