Hamburg 2001 – wissenschaftliches Programm
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AM: Magnetismus
AM 14: Dünne Schichten II
AM 14.7: Vortrag
Donnerstag, 29. März 2001, 16:30–16:45, S 5.2
Magnetic structure of thin Ho films: a comparative neutron and resonant magnetic x-ray scattering study — •C. Schüßler-Langeheine1, H. Ott1, A. Yu. Grigoriev1,2, D. V. Vyalikh1,2, E. Schierle1, E. Weschke1, G. Kaindl1, V. Leinert3, and H. Zabel3 — 1Institut für Experimentalphysik, Freie Universität Berlin, Arnimallee 14, D-14195 Berlin, Germany — 2Institute of Physics, St. Petersburg State University, Uljanovskaja 1, 198904 St. Petersburg, Russia — 3Institut für Experimentalphysik/Festkörperphysik, Ruhr-Universität Bochum, D-44780 Bochum, Germany
A comparative study of neutron and resonant magnetic soft x-ray scattering was performed on thin Ho-metal films grown by methods of molecular-beam epitaxy. In both cases, the temperature dependence of the (000+τ) satellite of the helical magnetic superstructure was studied, revealing that resonant magnetic scattering at the Ho-M5 edge reproduces the magnetic signal observed by neutron diffraction in all details. The huge enhancement of the magnetic x-ray scattering amplitude at the Ho-M5 edge allows very fast data acquisition with unprecedented quality and even permits critical-scattering studies in thin films of 46-Å thickness at temperatures well above the Néel temperature.