Hamburg 2001 – wissenschaftliches Programm
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AM: Magnetismus
AM 17: Mikromagnetismus II (Dots, Partikel)
AM 17.7: Vortrag
Freitag, 30. März 2001, 11:45–12:00, S 5.4
Imaging of in-plane magnetic domains with Magnetic Transmission X-ray Microscopy — •P. Fischer1, T. Eimüller1, G. Schütz1, M. Köhler2, G. Bayreuther2, G. Denbeaux3, and D. Attwood3 — 1Univ. Würzburg, EP IV, D-97074 Würzburg, Germany — 2Univ. Regensburg, D 93040 Regensburg, Germany — 3CXRO, LBL, Berkeley, CA 94720
Magnetic Transmission X-ray Microscopy (M-TXM) allows to image element-specifically magnetic domain structures with a lateral resolution down to 25nm provided by Fresnel zone plates used as optical elements. The magnetic contrast is given by X-ray magnetic circular dichroism, which occurs e.g. in the vicinity of Fe L2,3 edges (706 and 719eV). It depends on the relative orientation of the projection of the magnetization of the sample onto the photon propagation direction. Thus tilting the sample at an axis perpendicular to the photon beam direction images in-plane magnetized domains of thin magnetic films. The magnetic domain structure observed in a 3nm Cr/50nm Fe/6nm Cr thin film system prepared by e-beam evaporation onto a 100nm thin SiN membrane is presented. Potential out-of-plane contributions can be addressed by taking images under a tilt of 90∘. Images recorde in applied varying external magnetic fields allows to study the evolution of the magnetic domains within complete hysteresis loops which is of high relevance in technological magnetic systems of low dimensionality.