Hamburg 2001 – scientific programme

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DF: Dielektrische Festkörper

DF 3: Rastermethoden

DF 3.1: Invited Talk

Tuesday, March 27, 2001, 09:30–10:10, S18/19

3-Dimensional Electric Field Distribution Above and Below Dielectric (Ferroelectric) Surfaces:Nanoscale Measurements and Manipulation with Scanning Probe Microscopy — •Lukas Eng — Institut fuer Angewandte Photophysik, TU Dresden, Mommsenstr. 13, 01062 Dresden.

Nanoscale investigation of ferroic systems are currently of clue interest in device fabrication and analysis. We show that scanning force microscopy (SFM) is of valuable help in addressing questions of both dynamic and static stability of domains and domain walls. In this contribution polarization sensitive modes of SFM, i.e. friction force microscopy (FFM), dynamic force microscopy (DFM), and piezoresponse force microscopy (PFM) will be discussed. These techniques provide unique resolution of the sample topography including chemical heterogeneity and the domain wall width, recording of hysteresis loops on the nanometer scale, as well as the transient response when inducing ferroelectric switching of domains. Furthermore we discuss novel approaches on the nanometer scale when investigating thin ferroelectric films prepared by laser ablation or Sol-Gel deposition. Here differentiation between morphology induced mechanical and electrical properties and the true ferroelectric behavior is needed. Therefore we emphasize a combination of optical near-field microscopy (NSOM) and the methods of SFM described above.