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O: Oberflächenphysik
O 13: Postersitzung (Adsorption auf Oberfl
ächen, Oberfl
ächenreaktionen, Elektronische Struktur, Epitaxie und Wachstum, Halbleiteroberfl
ächen und Grenzfl
ächen, Oxide und Isolatoren)
O 13.27: Poster
Montag, 26. März 2001, 19:00–22:00, Foyer zu B
Detection of double-bonds in modified polymers with ARXPS — •Markus Bach1, Alfred Baalmann2, Ralf Wilken2, and Manfred Neumann1 — 1Universität Osnabrück, Fachbereich Physik, Barbarastrasse 7, 49069 Osnabrück — 2FhI für Angewandte Materialforschung, Wiener Strasse 12, 28359 Bremen
Several polymers have been modified with electrons, UV-light and in a plasma to induce different reactions in the surface region. One of these reactions is the formation of double-bonds. In order to detect these double-bonds with photoelectron spectroscopy, we have to label them in a chemical reaction with bromium because of the small chemical shifts in the binding energy of the main lines originating from single or double bonds. The depth distribution of double-bonds which were created by the different reactions was determined from angle dependent XPS measurements.