Hamburg 2001 – wissenschaftliches Programm
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O: Oberflächenphysik
O 13: Postersitzung (Adsorption auf Oberfl
ächen, Oberfl
ächenreaktionen, Elektronische Struktur, Epitaxie und Wachstum, Halbleiteroberfl
ächen und Grenzfl
ächen, Oxide und Isolatoren)
O 13.36: Poster
Montag, 26. März 2001, 19:00–22:00, Foyer zu B
Angular Resolved Measurements of the Spin-Orbit Branching Ratio in Soft-X-Ray Photoelectron Spectroscopy — •A. Oelsner1, G. H. Fecher1, M. Schicketanz1, J. Morais2, and G. Schönhense1 — 1Johannes Gutenberg-Universität Mainz — 2Universidade Federal do Rio Grande do Sul, Instituto de Fisica, Porto Alegre, RS, Brazil
The dichroism and polarization dependence of the spin-orbit branching ratio in angular resolved photoemission from solids excited by means of polarized photons is reported. Particularly, we have measured the spin-orbit branching-ratio in the photoemission from the 4f states of the single-crystalline samples Pt(111) and W(110). The results show that the branching ratio in angular resolved photoemission deviates significantly from the statistical value and depends on the photon polarization. The observed deviations are closely connected to the occurrence of dichroism in the angular distribution of photoelectrons, that are differences in the intensities if the polarization of the photons is changed. Various atomic and solid state effects have to be taken into account for the interpretation of the results. The observed effects are encouraging to develop new approaches for the extraction of information about the electronic structur on solid surfaces by means of angular resolved measurements of core-level photoemission.