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O: Oberflächenphysik
O 9: Organische Dünnschichten und Festkörper
O 9.3: Vortrag
Montag, 26. März 2001, 16:45–17:00, B
Real-time X-ray studies of the growth of PTCDA on Ag(111) — •B. Krause1, A. Dürr1, K. Ritley1, F. Schreiber1,2, H. Dosch1,2, and O. H. Seeck3 — 1Max-Planck-Institut für Metallforschung, Heisenbergstr. 1, D-70569 Stuttgart — 2Institut für Theoretische und Angewandte Physik, Universität Stuttgart, D-70550 Stuttgart — 3HASYLAB at DESY, Notkestr. 85, D-22603 Hamburg
A real-time growth study of PTCDA (3,4,9,10-perylenetetracarboxylic dianhydride) on Ag(111) using in situ X-ray scattering is presented. The evolution of the specularly reflected intensity at the anti-Bragg point of PTCDA is monitored during deposition. This method is comparable to RHEED growth oscillations, but offers the advantage of a purely kinematic treatment in the data analysis.
The experiments concentrate on the impact of substrate temperature and deposition rate on the growth. A Stransky-Krastanov growth scenario is found. The first two monolayers grow layer-by-layer, followed by islanding for successive layers. The transition to islanding, which is crucial for the evolution of roughness and strain of the films, is followed for a wide temperature range (-70 to 200∘C) and for different deposition rates.
It is shown how the time-dependent coverage of individual layers is extracted without referring to specific growth models.