Regensburg 2002 – scientific programme
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MA: Magnetismus
MA 13: Magnetische Dünne Schichten I
MA 13.12: Talk
Wednesday, March 13, 2002, 18:00–18:15, H10
X-ray resonant magnetic scattering from GMR thin film systems — •Michael Hecker1, Claus M. Schneider1, Hans-Christoph Mertins2, Franz Schaefers2, and Dirk Abramsohn2 — 1IFW Dresden, Helmholtzstr. 20, 01069 Dresden — 2BESSY GmbH, Albert-Einstein-Str. 15, 12489 Berlin
Magnetic and structural properties of magnetron-sputtered metallic multilayers were investigated by transport measurements, MOKE (magneto-optical Kerr effect) and diffraction experiments both in the hard and soft X-ray region. In particular, the unique possibilities of resonant magnetic scattering with polarized soft X-ray radiation were utilized to investigate the structural and magnetic properties simultaneously. X-ray reflectometry measurements with polarized radiation tuned to the L absorption edges of the constituent elements Co, Ni, and Fe indicate magnetic scattering, both due to the antiferromagnetic (afm) coupling of the magnetic layers in the zero magnetic field, and due to the switching into a ferromagnetic state at applied magnetic field. It is shown that magnetic effects can be more clearly resolved at the third order magnetic Bragg peak than at its first order. The magnetic switching is decomposed by means of element-selectively measured hysteresis loops. Results for Co/Cu- and CoFe/Cu/NiFe/Cu-multilayers are compared with the measurements at a spin valve structure containing an IrMn pinning layer.