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O: Oberflächenphysik
O 26: Postersitzung (Rastersondentechniken, Nanostrukturen, Teilchen und Cluster, Methodisches, Oxide und Isolatoren, Grenzfl
äche fest-flüssig, Struktur und Dynamik reiner Oberfl
ächen, Oberfl
ächenreaktionen, Zeitaufg. Spektroskopie, Phasenüberg
änge
O 26.35: Poster
Mittwoch, 13. März 2002, 14:30–17:30, Bereich C
Sharper images by focusing soft X-rays with photon sieves — •Lutz Kipp1, Matthias Kalläne1, Michael Skibowski1, Robert L. Johnson2, Richard Berndt1, Rainer Adelung1, Sönke Harm1, and Ralph Seemann3 — 1Institut für Experimentelle und Angewandte Physik, Universität D–24098 Kiel — 2Institut für Experimentalphysik, Universität D–22761 Hamburg — 3Niedmers & Seemann, Patent Attorneys, D–22767 Hamburg
Fresnel zone plates consisting of alternating transmissive and opaque circular rings can be used to focus X-rays [1]. The spatial resolution that can be achieved with these devices is of the order of the width of the outermost zone and is therefore limited by the smallest structure (20 nm – 40 nm) that can be fabricated by lithography today. Here we show that a large number of pinholes distributed appropriately over the Fresnel zones make it possible to focus soft X-rays to spot sizes smaller than the diameter of the smallest pinhole. In addition, higher orders of diffraction and secondary maxima can be suppressed by several orders of magnitude [2]. In combination with the next generation of synchrotron light sources (Free-Electron Lasers) these “photon sieves” offer new opportunities for highest resolution x-ray microscopy and spectroscopy in physical and life sciences.
[1] J. Thieme, G. Schmahl, D. Rudolph, and E. Umbach, X-Ray Microscopy and Spectroscopy (Springer, Berlin, 1996).
[2] L. Kipp, M. Skibowski, R. L. Johnson, R. Berndt, R. Adelung, S.
Harm & R. Seemann, Nature 414, 184 (2001).