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O: Oberflächenphysik

O 26: Postersitzung (Rastersondentechniken, Nanostrukturen, Teilchen und Cluster, Methodisches, Oxide und Isolatoren, Grenzfl
äche fest-flüssig, Struktur und Dynamik reiner Oberfl
ächen, Oberfl
ächenreaktionen, Zeitaufg. Spektroskopie, Phasenüberg
änge

O 26.66: Poster

Mittwoch, 13. März 2002, 14:30–17:30, Bereich C

X-ray photoelectron spectroscopy in the pressure gap — •Jörg Pantförder, Junfa Zhu, Dieter Borgmann, Reinhard Denecke, and Hans–Peter Steinrück — Physikalische Chemie II, Universität Erlangen-Nürnberg, Egerlandstraße 3, 91058 Erlangen

In an effort to extend the usable pressure range for electron based spectroscopies from UHV into the so-called ”pressure gap” region, we have built a new experimental setup for in-situ XP spectroscopy in a pressure range from UHV up to 1 mbar. The principle of the ”high pressure” cell is based on several stages of differentially pumping between sample and electron detection, and is in this respect similar to earlier experimental setups of other groups [1,2]. In our apparatus the measurements can be performed either by using an ambient pressure in the cell or by application of a ”choked flow”-beam. In the latter case the background pressure will be considerably lower than on the sample surface. As X-ray source a differentially pumped twin anode or an Al anode with monochromator can be used. Besides introducing the apparatus, first test experiments will be discussed. The detailed characterization of the ”choked flow”-beam with respect to its spatial shape, which has been performed in a separate ”test-chamber”, will also be presented. (Supported by the DFG Ste620/3-1,2)

[1] H.J. Ruppender, M. Grunze, C.W. Kong, Surf. Interface Anal. 15 (1990) 245.

[2] R.W. Joyner, M.W. Roberts, K. Yates, Surf. Sci. 87 (1979) 501.