Regensburg 2002 – scientific programme

Parts | Days | Selection | Search | Downloads | Help

SYME: Mechanical Properties of Thin Films

SYME III: HV III

Tuesday, March 12, 2002, 15:30–16:00, H 16

	15:30	SYME III.1	Invited Talk: In-situ Electron Microscopy Study of Dislocation Processes in Thin Metal Films — •Gerhard Dehm