Regensburg 2002 – scientific programme
Parts | Days | Selection | Search | Downloads | Help
SYME: Mechanical Properties of Thin Films
SYME III: HV III
Tuesday, March 12, 2002, 15:30–16:00, H 16
![]() |
15:30 | SYME III.1 | Invited Talk: In-situ Electron Microscopy Study of Dislocation Processes in Thin Metal Films — •Gerhard Dehm |