Regensburg 2002 – wissenschaftliches Programm

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SYOH: Organische Halbleiter

SYOH 7: Poster

SYOH 7.32: Poster

Montag, 11. März 2002, 18:00–21:00, C

The dependence of the electronic transport in organic thin films on their structural properties — •Jens Pflaum, Michael Münch, Burkhard Järisch, Peter Löffler, and Norbert Karl — 3. Physikalisches Institut, Universität Stuttgart, 70569 Stuttgart

We present investigations of the structural and electronic properties of thin films of diindenoperylene, pentacene, Pd-phthalocyanine, and hexathiophenes (DD6T and EC6T).

The samples were grown by vapour deposition in high vacuum on oxide-covered Si substrates.

Structural characterization was carried out by X-ray diffraction. The essential parameters estimated by X-ray analysis were the out-of-plane coherence (mosaicity) and the average grain size.

For investigating the electronic properties of the films, the field effect transistor (FET) geometry was used. The dark conductivity (gate voltage: U=0V) could be adjusted by oxygen doping.

FET mobilities increased with increasing grain sizes. These observations are discussed in relations to the structural film properties.

Support by DFG (K427/8-1) is gratefully acknowledged.