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SYPF: Struktur und Dynamik in dünnen Polymerfilmen
SYPF 2: Poster Session
SYPF 2.34: Poster
Donnerstag, 14. März 2002, 09:00–18:00, Poster B
Investigations on Pressure Sensitive Adhesive Surfaces with Pulsed Force Mode AFM — •Andreas Döring1, Roger Wepf2, and Andreas Westphal3 — 1Universität Ulm, Experimentelle Physik, Albert-Einstein-Allee 11, 89069 Ulm — 2Beiersdorf AG Hamburg, Analytical Research — 3tesa AG, Hamburg
Adhesive surfaces are difficult to measure with contact AFM because a good adhesive glues the tip to the surface. This makes lateral movement (in xy-direction) impossible.
Alternativly, acrylates and other viscous polymers can be scanned with non-contact methods such as Tapping Mode. These modes reveal no information about adhesion properties. However, the adhesion determined in force-distance measurements can be correlated with tack. (Tack is defined as separation energy after a short periode of contact.) For this reason we operate the AFM in Pulsed Force Mode: The tip touches the surface for about 100 µs and indents it with Fmax and then it is pulled away. The minimal force that occures during the separation is recorded and is called PFM-adhesion.