Dresden 2003 – wissenschaftliches Programm

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CPP: Chemische Physik und Polymerphysik

CPP 22: POSTER C

CPP 22.49: Poster

Donnerstag, 27. März 2003, 12:00–14:00, ZEU/250

Multiple length scales of thin immiscible ternary polymer blend films investigated with GISAXS and AFM — •P. Panagiotou¹, N. Hermsdorf², S. Mavila-Chathoth¹, I. Tokarev², and P. Müller-Buschbaum¹ — ¹TU München Physik Department LS E13, James-Franck-Str.1, 85747 Garching (Germany) — ²IPF Dresden e.V., Hohe Strasse 6, 01069 Dresden (Germany)

Due to their competitive fabrication and broad application in industry polymer blends become increasingly interesting. Particularly thin polymer films exhibit miscellaneous physical properties as compared to their bulk behavior. In the presented case three strongly immiscible polymers with different molecular weights and glass transition temperature were blended and spin coated onto a prior etched Si(100) wafer. Depending on the annealing time the samples shows various in-plane length scales. While with GISAXS (gracing incident of small-angle x-ray scattering) measurements the length scales inside the films as well as on top of the surface are detected, AFM (atomic force microscopy) pictures only the surface. Resulting length scales are compared showing the equilibrium structure dominated by one component.