Dresden 2003 – wissenschaftliches Programm
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CPP: Chemische Physik und Polymerphysik
CPP 22: POSTER C
CPP 22.60: Poster
Donnerstag, 27. März 2003, 12:00–14:00, ZEU/250
Investigation of temperature dependent mechanical properties of thin polymer films by Scanning Force Microscopy — •Martin Hinz1, Andreas Kleiner1, Sabine Hild1, Othmar Marti1, Urs Dürig2, Bernd Gotsmann2, and Peter Vettiger2 — 1Department of Experimental Physics, University of Ulm, 89069 Ulm — 2IBM Research Division, Zurich Research Laboratory, Saeumerstrasse 4, CH-8803 Rueschlikon/Switzerland
Scanning Force Microscopy (SFM) provides the possibility to probe mechanical properties on nanometer scale by force distance curve measurements. The indentation behaviour of a hard tip can be observed and characteristic quantities like slope or the energy of hysteresis can be analyzed. Combining the SFM with a heating device enables to investigate variations in the mechanical properties of thin films at elevated temperatures and in the glass transition range. In this study Polymethylmethacrylate films of thicknesses both smaller and larger than the radius of gyration (approx. 35 nm) are prepared by spin-coating on Silicon substrates and are investigated in the glass transition temperature (up to 130∘C). In addition to the force curve measurements the thermal stability of these nano structures (structure size <100nm) is determined by measuring the time evolution of the topography at elevated temperatures.