Dresden 2003 – wissenschaftliches Programm
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DS: Dünne Schichten
DS 24: Poster
DS 24.22: Poster
Dienstag, 25. März 2003, 14:30–17:00, P2a
Structure and annealing of C60 films — •Steffen Schulze1, Oksana Dmytrenko2, M. Kulish2, Michael Hietschold1, and Yu. Prylutskyy3 — 1TU Chemnitz, Institut für Physik, Analytik an Festkörperoberflächen, 09107 Chemnitz — 2Shevchenko Kyev University, Department of Physics — 3Shevchenko Kyev University, Department of Biology
We studied the crystalline structure and morphology of C60 films and it’s change by annealing using electron-microscopic methods and electron-diffraction. The C60 films were prepared by the method of the thermal vacuum evaporation of C60 powder with a purity 99.9 per cent. The sublimation temperature was equal to 730 K. The thermal annealing of the C60 films in the vacuum was carried out in a temperature range from 453 to 473 K for periods of 60 to 300 minutes. Before being annealed the C60 films have been found to be of fine-crystalline structure with some crystallites reaching a size of up to 1000 A. The crystallographic analysis of X-ray and electron diffraction patterns for the dense packed structure of the fullerite C60 results a = 1.414 nm to be the lattice parameter in the cubic system (fcc) [1]. Furthermore the electron diffraction patterns provide us with intra-molecular structure data of the individual C60 balls. Annealing the C60 films at 453 and 473 K leads to noticeable changes in morphology and crystalline structure of the fullerites. [1] O. Dmytrenko et al., Molecular Crystals and Liquid Crystals, 323, (2002).