Dresden 2003 – scientific programme
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DS: Dünne Schichten
DS 24: Poster
DS 24.42: Poster
Tuesday, March 25, 2003, 14:30–17:00, P2a
Organic−Organic Interfaces: Structure, Morphology, and Optical Properties — •J. O. Ossó1,2, F. Schreiber1,3,4, E. Barrena1, M. Garriga2, M. I. Alonso2, and H. Dosch1,4 — 1Max-Planck-Institut für Metallforschung, 70569 Stuttgart, Germany — 2Institut de Ciència de Materials de Barcelona CSIC, 08190 Bellaterra, Spain — 3University of Oxford, Oxford OX13QZ, UK — 4Universität Stuttgart, 70550 Stuttgart, Germany
The organic-organic interface is a key element for several organic device structures such as OLEDs. Several studies have been devoted to the investigation of the electronic properties of such interfaces, but the structure, morphology, and interdiffusion at the organic-organic interface is not well understood. We have investigated organic bilayers of the compounds copper-hexadecafluorophthalocyanine (F16CuPc) and diindenoperylene (DIP) grown by OMBD on oxidized Si(100) and Al2O3. For both compounds the behavior of the individual films is well characterized [1,2]. The optical properties of the bilayers were investigated by spectroscopic ellispometry and related to the structural properties probed by x-ray diffraction. The optical and electronic properties of the films, depend strongly on the final structure of the individual layers. While in the case of DIP on F16CuPc the properties of the bilayer system can be directly compared to the single layer case, F16CuPc on DIP appears to exhibit significant deviations. The implications for the preparation of organic heterostructures are discussed.
[1] Ossó et al., Adv. Funct. Mat. 12 (2002) 455
[2] Dürr et al., Appl. Phys. Lett. 81 (2002) 2276