Dresden 2003 – scientific programme

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DS: Dünne Schichten

DS 2: FV-internes Symposium „Dünnschichtanalytik“ II

Monday, March 24, 2003, 14:30–15:50, GER/37

	14:30	DS 2.1	Invited Talk: New Developments and Aplications in Electron Beam Analysis of Thin Films — •Michael Kopnarski
	15:10	DS 2.2	Invited Talk: Thin Film Analysis and Three-Dimensional Microanalysis with Time-of-Flight SIMS — •Ewald Niehuis