Dresden 2003 – wissenschaftliches Programm

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DY: Dynamik und Statistische Physik

DY 25: Growth processes and interface features I

DY 25.1: Vortrag

Dienstag, 25. März 2003, 15:00–15:15, G\"OR/229

Interfacial melting of ice in contact with SiO₂ — •Simon Engemann¹, Harald Reichert¹, Helmut Dosch¹, and Jörg Bilgram² — ¹MPI für Metallforschung, Heisenbergstr. 3, D-70569 Stuttgart — ²Laboratorium für Festkörperphysik, ETH, CH-8093 Zürich

The melting behaviour of ice in contact with rock and other materials has a crucial impact onto many phenomena in nature and everyday life, as for glaciers, permafrost and for friction. A hitherto unsolved problem is whether or not ice in contact with minerals shows interfacial premelting. Experimental evidence has been inconclusive so far, mainly due to the difficulties in probing deeply buried interfaces. We have performed insitu reflectivity measurements using 70 keV-high energy x-ray microbeams to study the SiO₂-ice interface. The experiments give for the first time clear evidence for the formation of a (quasi)liquid layer between SiO₂ and ice upon approaching the melting point. In comparison to the premelting at the free surface of ice the parameters of the growth law for the interface layer are significantly altered.