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HL: Halbleiterphysik

HL 14: Poster I

HL 14.44: Poster

Montag, 24. März 2003, 17:00–19:30, HSZ/P2

Time resolved measurements on multilayer OLEDs with special attention on electron mobility of Alq3 and layer thickness influences — •O. Schneider, F. Kozlowski, J. Blochwitz-Nimoth, M. Pfeiffer, and K. Leo — Institute for Applied Photophysics, TU Dresden, D-01062 Dresden, Germany

Time-resolved measurements with resolutions down to 80ns have been carried out at multilayer OLEDs with PII structure (p-doped hole transport layer, intrinsic emission layer and intrinsic electron transport layer). From the determination of the delay time of electroluminescence electron mobility data of Alq3 (aluminum-tris-quinolate) can be derived. The influence of different layer thickness of emitter and transport layer have been investigated.

The measured values are compared with data from a comprehensive numerical simulation. At high operating voltages a strong influence of the transport layer relaxation on the time behavior of the OLED can be observed. Furthermore, a method could be developed to eliminate the influence of the sample capacity and the series resistance of the measurement setup. Based on the simulation data the effectiveness of this method could be approved.