Dresden 2003 – wissenschaftliches Programm
Bereiche | Tage | Auswahl | Suche | Downloads | Hilfe
HL: Halbleiterphysik
HL 14: Poster I
HL 14.50: Poster
Montag, 24. März 2003, 17:00–19:30, HSZ/P2
Structural and optical anisotropy of poly(3-octylthiophene) films — •Tobias Erb1, Sofiya Raleva1, Uladzimir Zhokhavets1, Gerhard Gobsch1, Bernd Stühn1, Matthias Spode2, and Oliver Ambacher2 — 1Institute of Physics, Ilmenau Technical University, 98684 Ilmenau, Germany — 2Centre of Micro- and Nanotechnology, Ilmenau Technical University, 98684 Ilmenau, Germany
The structural properties of thin spin-coated poly(3-octylthiophene)-films were studied using X-ray reflection. The results provide information on the film thickness, the surface roughness and the electron density variation normal to the film surface. The degree of anisotropy of the films depends strongly on the film thickness, solvent type and polymer concentration in the solvent. In addition, the samples were studied with spectroscopic ellipsometry, which provides the anisotropic dielectric function of the films. It could be found that there is a close correlation between the results obtained by both methods. Especially, the experimental results can be explained in terms of a preferable orientation of the polymer chains parallel to the substrate.