Dresden 2003 – wissenschaftliches Programm

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M: Metallphysik

M 41: Postersitzung

M 41.39: Poster

Donnerstag, 27. März 2003, 14:30–16:30, HSZ

In-situ Measurements of Grain Boundary Migration in Al Bicrystals — •V.A. Ivanov, D.A. Molodov, G. Gottstein, and L.S. Shvindlerman — Institut für Metallkunde und Metallphysik, RWTH Aachen, 52056 Aachen, Germany

Results of measurements of grain boundary migration under a constant driving force in Al-bicrystals will be presented. In this technique the curved part of the boundary moves along the lateral surface of the sample forming the triple junction No-dqfree surface - boundary - free surfaceNo-dq on the sample surface during its motion.

The migration of a 38.7^∘<111> tilt grain boundary was measured in-situ in the temperature range between 440 and 550^∘C using both the X-ray interface continuous tracking method and a technique where the orientation contrast was revealed by an electron back scatter detector in the SEM. The contact angle at the tip of the junction was measured. The effect of the junction will be discussed in terms of the criterion Λ, which defines the influence of a triple junction on the motion of the attached grain boundaries.

The measurements of boundary motion on samples with different width of the shrinking grain reveals a linear scaling of boundary velocity with the driving force. The results supports the hypothesis that the No-dqsurfaceNo-dq triple junction does not affect boundary in the investigated temperature range.