Dresden 2003 – scientific programme

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MA: Magnetismus

MA 14: Poster: Schichten(1-31), Spinabh.Trsp.(32-47), Exch.Bias(48-54), Spindyn.(55-64), Mikromag.(65-76), Partikel(77-88), Oflmag.(89-92), Spinelektr.(93-98), Elektr.Theo.(99-103), Mikromag+PhasÜ+Aniso.(104-122), MagnMat.(123-134), Messm+Mol-Mag.(135-139), Kondo(140-151)

MA 14.29: Poster

Tuesday, March 25, 2003, 15:15–19:15, Zelt

Scanning tunneling microscopy study of the growth of antiferromagnetic Fe₅₀Mn₅₀ layers on Cu(001) — •L. I. Chelaru, W. Kuch, and J. Kirschner — Max-Planck-Institut für Mikrostrukturphysik, Weinberg 2, 06120 Halle

The details of the interface between a ferromagnetic (FM) and an antiferromagnetic (AF) thin film strongly influence the phenomena resulting from the magnetic coupling between FM and AF layers. The use of epitaxial single-crystalline layers provides the opportunity to study FM-AF coupling at well defined interfaces. Because of the low lattice mismatch (≈ 0.4%), FeMn films grown in an epitaxial layer-by-layer growth mode on a Cu(001) single crystal are ideal candidates for such investigations. We present a scanning tunneling microscopy (STM) study of the growth and the morphology of ultrathin Fe₅₀Mn₅₀ alloy films on Cu(001). Topographic STM images corresponding to Fe₅₀Mn₅₀ film thicknesses above 10 ML reveal large and atomically flat terraces with small holes (≈ 5 nm length) of one atomic layer depth (≈ 1.8 Å). In addition, a fine structure with an apparent corrugation height of about 0.5 Å is recognized. Scanning tunneling spectroscopy measurements prove the spectroscopic origin of this corrugation. It is attributed to local concentration differences of the constituents of the chemically disordered FeMn alloy.