Dresden 2003 – wissenschaftliches Programm
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MA: Magnetismus
MA 17: Magnetische Dünne Schichten II
MA 17.3: Vortrag
Mittwoch, 26. März 2003, 16:30–16:45, HSZ/04
Transverse and Linear Magneto-Optical Kerr-Effect in the Soft X-ray Regime at Thin Iron Films — •Joachim Bansmann1, Armin Kleibert1, Volkmar Senz1, Dirk Abramsohn2, Sergio Valencia2 und Hans-Christoph Mertins2 — 1Fachbereich Physik, Universität Rostock, 18051 Rostock — 2BESSY GmbH, 12489 Berlin
In this contribution we will report on angle resolved X-ray reflection measurements from thin iron films using the transverse and linear magneto-optical Kerr effect. The investigations have been carried out with tuneable, linearly polarized soft X-rays at the storage ring BESSY in Berlin in the photon energy regime of the Fe 2p and 3p levels. The samples, which are capped with silver against oxidation, have been prepared both by MBE on W(110) and via sputtering on silicon. In contrast to the visible regime, the data for the transverse X-MOKE clearly show huge intensity differences when reversing the magnetization. Moreover, the MOKE results show a strong dependence on the angle of reflection as well as on the photon energy. Our data display a small intensity difference between the transverse and the longitudinal MOKE (averaged magnetization directions) which is related to a quadratic dependence on the magnetization. This effect has been predicted by Oppeneer and coworkers [1]. We were also able to detect the Kerr rotation at the Fe 3p level in the case of linear MOKE. This value is in the order of 1∘ and thus much larger than in the visible regime.
[1] P.M. Oppeneer et al., Phys. Rev. B (2002), in press.