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MA: Magnetismus
MA 2: Magnetische Dünne Schichten I
MA 2.6: Talk
Monday, March 24, 2003, 11:30–11:45, HSZ/04
Growth and Characterization of sputtered ultrathin Co/Pt films using an ECR Ion Source — •Michael Wellhöfer, Rainer Anton, Sabine Pütter, and Hans Peter Oepen — Jungiusstr. 11, 20355 Hamburg
In recent years Co/Pt multilayers got into the focus of the actual research as they show a variety of fascinating magnetic properties. In the range of a few atomic monolayers Co exhibits a perpendicular magnetization predominantly due to its interface anisotropy. The interface anisotropy is determined by the growth mode and the surface of the substrate or seed layer, respectively. Using an Electron Cyclotron Resonance (ECR) Ion Source we have produced ultrathin films of Co in the monolayer range. We find ferromagnetism with perpendicular anisotropy down to a thickness of two monolayers. The films are grown on a Pt layer, that serves as seed layer simultaneously. The thickness of this buffer layer is varied in thickness between 30 and 60 monolayers. The ECR-technique allows to directly deposit Pt on various substrates (Si, GaAs, etc.) without changing the magnetic properties of the Co films. The crystalline structure and the surface roughness of the Co/Pt films are investigated by means of Transmission Electron Microscopy and Scanning Tunneling Microscopy, respectively. The magnetic properties of the fabricated films are studied ex situ utilizing the Magneto Optic Kerr Effect.