Dresden 2003 – wissenschaftliches Programm

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MA: Magnetismus

MA 8: Magnetische Kopplungsph
änomene / Exchange Bias

MA 8.3: Vortrag

Montag, 24. März 2003, 15:45–16:00, HSZ/405

Layer-resolved microscopy study of magnetic interlayer coupling by domain wall stray fields — •W. Kuch, L. I. Chelaru, K. Fukumoto, F. Porrati, F. Offi, M. Kotsugi, and J. Kirschner — Max-Planck-Institut für Mikrostrukturphysik, Weinberg 2, 06120 Halle

The magnetic interlayer coupling of epitaxial Co/Cu/Ni trilayers on Cu(001) was studied by photoelectron emission microscopy (PEEM) using x-ray magnetic circular dichroism (XMCD) in soft x-ray absorption as element-selective magnetic contrast mechanism. In these trilayers the Ni layers are magnetized perpendicularly to the film plane, whereas the Co magnetization is in the film plane. Comparison of the as-grown layer-resolved magnetic domain images of the Co and Ni layers reveals the influence of magnetostatic stray fields from Ni domain walls on the Co domain pattern. The effect is quantified by comparing to the effect of external magnetic fields, and is found to be equivalent to about 250 Oe. This observation is confirmed by micromagnetic simulations using the Landau-Lifshitz-Gilbert equation, which show that, although locally the stray field from the Ni domain walls at the position of the Co layer is even higher, the effect is significantly reduced by exchange averaging within the Co layer.