Dresden 2003 – wissenschaftliches Programm

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O: Oberflächenphysik

O 10: Elektronische Struktur II

O 10.6: Vortrag

Montag, 24. März 2003, 16:15–16:30, FOE/ORG

Microspectroscopic two-dimensional Fermi surface mapping using a photoelectron emission microscope — •M. Kotsugi, W. Kuch, F. Offi, L. I. Chelaru, and J. Kirschner — Max-Planck-Institut für Mikrostrukturphysik, Weinberg 2, D-06120 Halle

We demonstrate the use of a photoelectron emission microscope (PEEM) in connection with a retarding field electron energy analyzer for the fast acquisition of two-dimensional momentum resolved photoelectron angular distribution patterns. This opens the possibility to combine spatial, momentum, and energy resolution of photoelectrons within the same instrument. While the common usage of PEEM is to obtain spatially resolved microscopic images of the sample surface, it is also possible to obtain electron momentum resolution of the component parallel to the surface by changing the projection electron lens optics settings to display the focal plane instead of the image plane. If the transmitted electrons are energy-filtered, the projected image in this mode represents the photoelectron angular distribution pattern. We have applied this to observe the Fermi surface from a selected region of a Cu(001) sample. A well defined bulk Fermi surface is quickly mapped in this way with an energy resolution better than 0.62 eV and momentum resolution better than 0.2 Å⁻¹.