O 18: Rastersondentechniken II
Tuesday, March 25, 2003, 11:15–12:45, M\"UL/ELCH
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11:15 |
O 18.1 |
Surface State versus Tip-Sample Distance in a Scanning Tunneling Microscope — •Laurent Limot, Thomas Maroutian, Peter Johansson, and Richard Berndt
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11:30 |
O 18.2 |
Controlled motion and manipulation of nanometer-sized antimony particles using dynamic force microscopy — •Claudia Ritter, Markus Heyde, Udo D. Schwarz, and Klaus Rademann
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11:45 |
O 18.3 |
A detailed study of photo-assisted tunneling spectroscopy and its application to polycristalline CIS solar cell surfaces — •U. Herber, C. Heske, E. Umbach, F. Karg und T. Niesen
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12:00 |
O 18.4 |
High-Resolution Near-Field Optical Imaging of Single Nuclear Pore Complexes — •Christiane Höppener, Daniel Molenda, Harald Fuchs, and Andreas Naber
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12:15 |
O 18.5 |
Modellierung der Feldverstärkung an metallischen Spitzen — •Jan Renger, Ingo Hellmann, Stefan Grafström, Volker Deckert und Lukas M. Eng
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12:30 |
O 18.6 |
Integrated System Solutions for Nanotechnology: High Resolution SEM combined with state-of-the-art SPM Technology — •Markus Maier, J. Zach, J. Bihr, J. Westermann, G. Schaefer, A. Feltz, and T. Berghaus
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