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O: Oberflächenphysik
O 27: Organische Dünnschichten I
O 27.1: Vortrag
Donnerstag, 27. März 2003, 11:15–11:30, HSZ/02
Differential Reflection Spectroscopy of ordered organic thin films: I. PTCDA on Mica — •Holger Proehl, Robert Nitsche, Thomas Dienel, and Torsten Fritz — Institut für Angewandte Photophysik, Technische Universität Dresden, 01062 Dresden
Research activity on molecular solids has gathered pace in recent years as these materials have a wide range of interesting properties, emerging industrial interest with real applications at the horizon, and possible future applications that will enable electronics to move into the nanoscale. High quality samples, precise structural data, and a detailed understanding of the physical properties is essential, with special emphasis on thin films and interfaces. In this respect, the use of highly controlled growth techniques like Organic Molecular Beam Epitaxy (OMBE) is becoming more and more important, aiming at high quality thin films with controlled crystal structure and morphology, therefore displaying well defined physical properties.
Here we present a facility to investigate the optical properties of organic ultrathin films by means of Differential Reflectance Spectroscopy (DRS). It offers the possibility to measure optical spectra in-situ during the film growth process over a wide spectral range. For ordered Mono- to Multilayer films of PTCDA (3,4,9,10-perylenetetracarboxylic dianhydride) on Mica-surfaces, these DR-spectra can be easily related to the absorption of the film. The formation of the solid state absorption beginning from monomer absorption, changing to dimer- and further to crystal like absorption spectra can be well observed.