Dresden 2003 – wissenschaftliches Programm
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O: Oberflächenphysik
O 30: Methodisches (Experiment und Theorie)
O 30.1: Vortrag
Donnerstag, 27. März 2003, 11:15–11:30, M\"UL/ELCH
Total and Partial Electron Yield X-ray Absorption Spectroscopy (XAS) under Ambient Conditions - a Variety of Applications using Gas Microstrip Detectors — •A. Vollmer1, J.D. Lipp2, H. Weiss3, and T. Rayment1 — 1University of Cambridge, UK — 2Rutherford Appleton Laboratory, UK — 3Universität Magdeburg, Germany
Gas microstrip detectors (GMSD) used as energy resolving proportional counters open new possibilities in surface and material science, catalysis, surface sensitive x-ray scanning microscopy, wear, and possibly even electrochemistry. We report upon a variety of experiments carried out under ambient conditions using this novel technique. The flexibility of GMSDs in terms of materials as well as detector gases allows bridging both the materials and pressure gap. Amongst the experiments addressed in this paper are studies of partial oxidation catalysts. For the first time a core-shell structure of the grains of vanadium containing catalyst powders could be seen under ambient conditions. We discuss in situ reductions of metal oxides at elevated temperatures (monitoring surface and bulk properties simultaneously), depth profiling in dry and aqueous gas mixtures, lubricant oil studies in wear, and scanning x-ray microprobe investigations. Combining the depth profiling performance of the GMSD with a spatial resolving set-up (microfocus x-ray beam, piezo driven sample) 3-dimensionally resolved XAS is feasible.