Dresden 2003 – wissenschaftliches Programm

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O: Oberflächenphysik

O 30: Methodisches (Experiment und Theorie)

O 30.6: Vortrag

Donnerstag, 27. März 2003, 12:30–12:45, M\"UL/ELCH

Aberration corrected spectromicroscopy with energy filtering: the SMART project — •Th. Schmidt¹, U. Groh¹, R. Fink¹, E. Umbach¹, H. Marchetto², O. Schaff², W. Engel², H. Kuhlenbeck², A.M. Bradshaw², R. Schlögl², H.-J. Freund², P. Hartel³, R. Spehr³, H. Rose³, G. Lilienkamp⁴, E. Bauer⁴, G. Benner⁵, and D. Preikszas⁵ — ¹Exp. Physik II, Universität Würzburg — ²Fritz-Haber-Institut, Berlin — ³Technische Hochschule Darmstadt — ⁴Technische Universität Clausthal — ⁵LEO GmbH, Oberkochen

The SMART spectromicroscope currently under construction aims at a lateral resolution of 2 nm with an energy resolution of 100 meV and is worldwide the most ambitious project in the field of spectroscopic microscopy. Besides microscopy as imaging method to investigate surfaces, the OMEGA-energyfilter enables photoelectonspectroscopy and electron diffraction as well as combinations thereof (e.g. spectroscopy at individual, nanometer sized surface objects). This extremely high lateral resolution (theoretical limit 0.3 nm) together with a gain in transmission of up to two orders of magnitude can only be obtained by the simultaneous correction of both, the spherical and chromatic aberrations of the lens system. This will be done by an electrostatic tetrode mirror combined with a highly symmetrical magnetic beam-splitter. We will report on the current state of the microscope which is installed as an intermediate set-up at the high-brilliance undulator-beamline UE52 at BESSY II in Berlin. We will also give an overview about the recently applied methods to investigate dynamical ultra-thin organic film growth.